Year	2005
Authors	Wei-Hsiu Hung
Paper Title	Depth-profile study of the electronic structures at Ga2O3(Gd2O3) and Gd2O3-GaN interfaces by X-ray photoelectron spectroscopy
Journal Title	. T.S. Lay, Y.Y. Liao, W.H. Hung, M. Hong, J. Kwo, J.P. Mannaerts, Depth-profile study of the electronic structures at Ga2O3(Gd2O3) and Gd2O3-GaN interfaces by X-ray photoelectron spectroscopy J. Crystal Growth 278 (2005) p.624-628. 1.681
Vol.No	278
Date of Publication	2005-05-01